Jitai Purchases Coxem Em-30ax+ Scanning Electron Microscope

Jitai's recent acquisition of the COXEM EM-30AX PLUS marks a significant advancement in its commitment to prioritize quality control as the cornerstone of its strategy to expand its market share. 

The COXEM EM-30AX PLUS, a highly precise Scanning Electron Microscope (SEM), enables the examination of minuscule sample materials with remarkable detail. It offers in-depth, focused images at exceptionally high magnifications of up to 150,000x.Significantly, this SEM leverages an electron beam with a concise wavelength, amplifying resolution by fine-tuning parameters such as accelerating voltage, working distance, and electron beam size.Setting itself apart from its precursor, the EM-30AX PLUS enables advanced morphological analyses. Its key enhancement lies in the integration of miniaturized microanalysis directly within the device, empowering Jitai to analyze materials both morphologically and compositionally. With the addition of the Energy Dispersive X-ray Spectroscopy (EDS) detector, pinpointing problematic areas or mapping chemical elements within the sample becomes feasible. 

The EM-30AX PLUS achieves an impressive 5nm resolution, ensuring meticulous quality analysis even at the nano-level. With its versatile operating voltage range spanning from 1 to 30kV, the instrument finds applications across various fields including nanotechnology, metals characterization, and alloys, augmenting Jitai's quest for seamless production capabilities.